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Ultra-high precision silicon isotope micro-analysis using a Cameca IMS-1280 SIMS instrument by eliminating the topography effect
Liu, Yu1,2; Li, Xian-Hua1,2; Tang, Guo-Qiang1,2; Li, Qiu-Li1,2; Liu, Xiao-Chi1; Yu, Hui-Min3; Huang, Fang3
2019-05-01
Source PublicationJOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
ISSN0267-9477
Volume34Issue:5Pages:906-914
AbstractSilicon (Si) is the second most abundant element in the silicate Earth. Secondary ion mass spectrometry (SIMS) was previously applicable only for low temperature geological processes because of its relatively low precision (+/- 0.3 parts per thousand, 2SD) when used to measure limited Si isotopic variations in high temperature geological processes. To extend the application of Si isotopes, a SIMS protocol for ultra-high precision and accuracy Si isotope measurements was developed in this study using a Cameca IMS-1280. By using high primary beam intensities (10 to 14 nA) and a long acquisition time (160 s), an internal precision of +/- 0.07 parts per thousand (2SE) and external precision (reproducibility) of +/- 0.10 parts per thousand (2SD) were achieved for spot-to-spot analysis on a perfectly flat surface (NIST610 glass). The topography effect significantly degraded the external precision for small-grained quartz crystals. Fortunately, there is a tight correlation between measured delta Si-30 and a secondary beam centering parameter (DTCA-X value). By using the DTCA-X correction, both the external repeatability and accuracy were improved. The Si isotope analysis of nine unknown quartz samples by using this newly developed SIMS method was in good agreement (within +/- 0.1 parts per thousand uncertainty) with solution MC-ICP-MS results.
DOI10.1039/c8ja00431e
Funding OrganizationChinese State Key Research and Development Program ; Chinese State Key Research and Development Program ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Chinese State Key Research and Development Program ; Chinese State Key Research and Development Program ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Chinese State Key Research and Development Program ; Chinese State Key Research and Development Program ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Chinese State Key Research and Development Program ; Chinese State Key Research and Development Program ; National Natural Science Foundation of China ; National Natural Science Foundation of China
WOS KeywordRATIOS
Language英语
Funding ProjectChinese State Key Research and Development Program[2016YFE0203000] ; National Natural Science Foundation of China[41673059] ; National Natural Science Foundation of China[41490632]
Funding OrganizationChinese State Key Research and Development Program ; Chinese State Key Research and Development Program ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Chinese State Key Research and Development Program ; Chinese State Key Research and Development Program ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Chinese State Key Research and Development Program ; Chinese State Key Research and Development Program ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; Chinese State Key Research and Development Program ; Chinese State Key Research and Development Program ; National Natural Science Foundation of China ; National Natural Science Foundation of China
WOS Research AreaChemistry ; Spectroscopy
WOS SubjectChemistry, Analytical ; Spectroscopy
WOS IDWOS:000485195500011
PublisherROYAL SOC CHEMISTRY
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.iggcas.ac.cn/handle/132A11/93569
Collection岩石圈演化国家重点实验室
Corresponding AuthorLi, Xian-Hua
Affiliation1.Chinese Acad Sci, State Key Lab Lithospher Evolut, Inst Geol & Geophys, Beijing 100029, Peoples R China
2.Univ Chinese Acad Sci, Coll Earth & Planetary Sci, Beijing 100049, Peoples R China
3.Univ Sci & Technol China, Sch Earth & Space Sci, CAS Key Lab Crust Mantle Mat & Environm, Hefei 230026, Anhui, Peoples R China
Recommended Citation
GB/T 7714
Liu, Yu,Li, Xian-Hua,Tang, Guo-Qiang,et al. Ultra-high precision silicon isotope micro-analysis using a Cameca IMS-1280 SIMS instrument by eliminating the topography effect[J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY,2019,34(5):906-914.
APA Liu, Yu.,Li, Xian-Hua.,Tang, Guo-Qiang.,Li, Qiu-Li.,Liu, Xiao-Chi.,...&Huang, Fang.(2019).Ultra-high precision silicon isotope micro-analysis using a Cameca IMS-1280 SIMS instrument by eliminating the topography effect.JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY,34(5),906-914.
MLA Liu, Yu,et al."Ultra-high precision silicon isotope micro-analysis using a Cameca IMS-1280 SIMS instrument by eliminating the topography effect".JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY 34.5(2019):906-914.
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