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NanoSIMS measurements of sub-micrometer particles using the local thresholding technique
Hao, Jialong1,2; Yang, Wei1,2; Huang, Wenjuan3; Xu, Yuchen1,2; Lin, Yangting1,2; Changela, Hitesh1,2
2019-12-12
Source PublicationSURFACE AND INTERFACE ANALYSIS
ISSN0142-2421
Pages6
AbstractNanoSIMS has been the most widely used analytical technique for measuring the elemental and isotopic ratios of micrometer to sub-micrometer particles, e.g., pre-solar grains, soil particles, and fog-helium aerosol particles. Automated sample stage movement combined with particle recognition algorithm is commonly used to improve analytical efficiency. However, due to the effect of sample topography or variation in ion yield rates, the global thresholding method used in previous studies has a low recognition rate. In order to improve the recognition rate, here we have developed a high-efficiency sub-micron particle recognition method. This method searches for the threshold that minimizes the intra-class variance of the local domain (the radius of the local is set to 10 pixels). The central pixel of this circular ROI is then tested against the threshold found for this region. Presolar grains from the Qingzhen (EH3) meteorite and soil organic particles from Oxisol were analyzed. The analytical efficiency was improved by 120-200% compared with the global thresholding algorithms. This method can be widely applied in automated studies of large numbers of micrometer to sub-micrometer particles.
Keywordlocal thresholding segmentation NanoSIMS particles analysis
DOI10.1002/sia.6711
Funding OrganizationNational Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China
WOS KeywordMATTER ; DUST
Language英语
Funding ProjectNational Natural Science Foundation of China[41503013] ; National Natural Science Foundation of China[41890843] ; National Key Research and Development Program of China[2018YFA 0702601]
Funding OrganizationNational Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Natural Science Foundation of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China ; National Key Research and Development Program of China
WOS Research AreaChemistry
WOS SubjectChemistry, Physical
WOS IDWOS:000502268800001
PublisherWILEY
Citation statistics
Document Type期刊论文
Identifierhttp://ir.iggcas.ac.cn/handle/132A11/95783
Collection地球与行星物理院重点实验室
Corresponding AuthorYang, Wei
Affiliation1.Chinese Acad Sci, Inst Geol & Geophys, Key Lab Earth & Planetary Phys, Beijing 100029, Peoples R China
2.Chinese Acad Sci, Innovat Acad Earth Sci, Beijing, Peoples R China
3.Iowa State Univ, Dept Ecol Evolut & Organismal Biol, Ames, IA USA
First Author AffilicationInstitute of Geology and Geophysics, Chinese Academy of Sciences
Corresponding Author AffilicationInstitute of Geology and Geophysics, Chinese Academy of Sciences
Recommended Citation
GB/T 7714
Hao, Jialong,Yang, Wei,Huang, Wenjuan,et al. NanoSIMS measurements of sub-micrometer particles using the local thresholding technique[J]. SURFACE AND INTERFACE ANALYSIS,2019:6.
APA Hao, Jialong,Yang, Wei,Huang, Wenjuan,Xu, Yuchen,Lin, Yangting,&Changela, Hitesh.(2019).NanoSIMS measurements of sub-micrometer particles using the local thresholding technique.SURFACE AND INTERFACE ANALYSIS,6.
MLA Hao, Jialong,et al."NanoSIMS measurements of sub-micrometer particles using the local thresholding technique".SURFACE AND INTERFACE ANALYSIS (2019):6.
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